Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter
Abbreviated Journal Title
carbon nanotubes; focused-ion-beam; field emission; ELECTRON-EMISSION; BREAKDOWN; Chemistry, Physical; Materials Science, Multidisciplinary
We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements arc carried out in a vacuum of 10(-7) Torr. Threshold voltage as low as 120 V has been obtained. (C) 2005 Elsevier Ltd. All rights reserved.
"Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter" (2005). Faculty Bibliography 2000s. 5048.