Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review

    Authors

    W. Ngwa; W. Luo; A. Kamanyi; K. W. Fomba;W. Grill

    Comments

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    Abbreviated Journal Title

    J. Microsc.-Oxf.

    Keywords

    atomic force microscopy (AFM); phase-sensitive acoustic microscopy; (PSAM); polymer thin films; thin film structure and physical properties; LINE-FOCUS BEAM; ULTRASONIC MICROSCOPY; ELASTIC PROPERTIES; SUPERFLUID-HELIUM; SCANNING ELECTRON; WAVE VELOCITY; CONSTANTS; THICKNESS; CONTRAST; CELLS; Microscopy

    Abstract

    The potential of phase-sensitive acoustic microscopy (PSAM) for characterizing polymer thin films is reviewed in comparison to atomic force microscopy (AFM). This comparison is based on results from three-dimensional vector contrast imaging and multimodal imaging using PSAM and AFM, respectively. The similarities and differences between the information that can be derived from the AFM topography and phase images, and the PSAM phase and amplitude micrographs are examined. In particular, the significance of the PSAM phase information for qualitative and quantitative characterization of the polymer films is examined for systems that generate surface waves, and those that do not. The relative merits, limitations and outlook of both techniques, individually, and as a complementary pair, are discussed.

    Journal Title

    Journal of Microscopy-Oxford

    Volume

    218

    Publication Date

    1-1-2005

    Document Type

    Review

    Language

    English

    First Page

    208

    Last Page

    218

    WOS Identifier

    WOS:000229369200002

    ISSN

    0022-2720

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