Title
Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review
Abbreviated Journal Title
J. Microsc.-Oxf.
Keywords
atomic force microscopy (AFM); phase-sensitive acoustic microscopy; (PSAM); polymer thin films; thin film structure and physical properties; LINE-FOCUS BEAM; ULTRASONIC MICROSCOPY; ELASTIC PROPERTIES; SUPERFLUID-HELIUM; SCANNING ELECTRON; WAVE VELOCITY; CONSTANTS; THICKNESS; CONTRAST; CELLS; Microscopy
Abstract
The potential of phase-sensitive acoustic microscopy (PSAM) for characterizing polymer thin films is reviewed in comparison to atomic force microscopy (AFM). This comparison is based on results from three-dimensional vector contrast imaging and multimodal imaging using PSAM and AFM, respectively. The similarities and differences between the information that can be derived from the AFM topography and phase images, and the PSAM phase and amplitude micrographs are examined. In particular, the significance of the PSAM phase information for qualitative and quantitative characterization of the polymer films is examined for systems that generate surface waves, and those that do not. The relative merits, limitations and outlook of both techniques, individually, and as a complementary pair, are discussed.
Journal Title
Journal of Microscopy-Oxford
Volume
218
Publication Date
1-1-2005
Document Type
Review
Language
English
First Page
208
Last Page
218
WOS Identifier
ISSN
0022-2720
Recommended Citation
"Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review" (2005). Faculty Bibliography 2000s. 5511.
https://stars.library.ucf.edu/facultybib2000/5511
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu