Characterization of individual L1(0) FePt nanoparticles

    Authors

    R. V. Petrova; R. R. Vanfleet; D. Richardson; B. Yao;K. R. Coffey

    Comments

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    Abbreviated Journal Title

    IEEE Trans. Magn.

    Keywords

    diffraction; electron microscopy; magnetic materials; nanotechnology; Engineering, Electrical & Electronic; Physics, Applied

    Abstract

    The long-range order parameter of [001]-oriented FePt L1(0) nanoparticles has been determined by measurement of convergent-beam electron diffraction (CBED) intensities of single particles using scanning transmission electron microscopy (STEM) and comparison of the measured intensities to simulations of diffracted-beam intensities. The nanoparticles were fabricated by co-sputtering high-purity Fe and Pt targets onto SiO2-Si substrates and annealing the deposited material.

    Journal Title

    Ieee Transactions on Magnetics

    Volume

    41

    Issue/Number

    10

    Publication Date

    1-1-2005

    Document Type

    Article; Proceedings Paper

    Language

    English

    First Page

    3202

    Last Page

    3204

    WOS Identifier

    WOS:000232679700207

    ISSN

    0018-9464

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