FIB cross-sectioning of a single rapidly solidified hypereutectic Al-Si powder particle for HRTEM

    Authors

    K. E. Rea; A. Agarwal; T. McKechnie;S. Seal

    Comments

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    Abbreviated Journal Title

    Microsc. Res. Tech.

    Keywords

    AL-20SI ALLOY; MICROSTRUCTURE; COMPOSITES; FE; Anatomy & Morphology; Biology; Microscopy

    Abstract

    A creative technique of in-situ focused ion beam (FIB) extraction was introduced to prepare a gas atomized rapidly solidified hypereutectic Al-Si single particle's cross-section for High Resolution Transmission Electron Microscopy (HRTEM) analysis. This preparation technique may be employed to characterize very inimitable samples that are abnormally wrought or intricate to prepare through traditional techniques. TEM results revealed that a gas-atomization/rapid solidification process leads to a homogeneous dispersion of 50-100-nm Si phase in the Al matrix. Stacking faults and dislocations are observed in the microstructure and will ultimately lead to the increased strength in a resultant bulk material manufactured from this powder to be further examined. (c) 2005 Wiley-Liss. Inc.

    Journal Title

    Microscopy Research and Technique

    Volume

    66

    Issue/Number

    1

    Publication Date

    1-1-2005

    Document Type

    Article

    Language

    English

    First Page

    10

    Last Page

    16

    WOS Identifier

    WOS:000228385200002

    ISSN

    1059-910X

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