Authors

Y. H. Wu; J. H. Lee; Y. H. Lin; H. W. Ren;S. T. Wu

Comments

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Abbreviated Journal Title

Opt. Express

Keywords

PHOTOELASTIC MODULATOR; BIREFRINGENCE; Optics

Abstract

A new method for simultaneously measuring the phase retardation and optic axis of a uniaxial compensation film is demonstrated using an axially-symmetric sheared polymer network liquid crystal (SPNLC). By overlaying a tested compensation film with a calibrated SPNLC cell between crossed polarizers, two dark spots are clearly observed in a CCD image. From the orientation direction and distance of these two spots, the optic axis and phase retardation value of the compensation film can be determined. This method is particularly useful for those optical systems whose optic axis and phase retardation are dynamically changing.

Journal Title

Optics Express

Volume

13

Issue/Number

18

Publication Date

1-1-2005

Document Type

Article

Language

English

First Page

7045

Last Page

7051

WOS Identifier

WOS:000231719600043

ISSN

1094-4087

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