Title

Generalization of the Rouard method to an absorbing thin-film stack and application to surface plasmon resonance

Authors

Authors

P. Lecaruyer; E. Maillart; M. Canva;J. Rolland

Comments

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Abbreviated Journal Title

Appl. Optics

Keywords

REFLECTION; SILVER; WAVES; Optics

Abstract

In the context of surface plasmon resonance (SPR) kinetic biochips, it is important to model the SPR phenomenon (i.e., extinction of reflectivity) toward biochip design and optimization. The Rouard approach that models reflectivity off a thin-film stack is shown to be extendable to any number of absorbing layers with no added complexity. Using the generalized Rouard method, the effect of SPR is simulated as a function of the wavelength for various metal thicknesses. Given an optimal metal thickness, the dependence of SPR on the angle of incidence and wavelength is also demonstrated. Such a model constitutes a potential basis for the efficient design and optimization of multidimensional sensors. (c) 2006 Optical Society of America.

Journal Title

Applied Optics

Volume

45

Issue/Number

33

Publication Date

1-1-2006

Document Type

Article

Language

English

First Page

8419

Last Page

8423

WOS Identifier

WOS:000242196700004

ISSN

1559-128X

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