Generalization of the Rouard method to an absorbing thin-film stack and application to surface plasmon resonance

    Authors

    P. Lecaruyer; E. Maillart; M. Canva;J. Rolland

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Appl. Optics

    Keywords

    REFLECTION; SILVER; WAVES; Optics

    Abstract

    In the context of surface plasmon resonance (SPR) kinetic biochips, it is important to model the SPR phenomenon (i.e., extinction of reflectivity) toward biochip design and optimization. The Rouard approach that models reflectivity off a thin-film stack is shown to be extendable to any number of absorbing layers with no added complexity. Using the generalized Rouard method, the effect of SPR is simulated as a function of the wavelength for various metal thicknesses. Given an optimal metal thickness, the dependence of SPR on the angle of incidence and wavelength is also demonstrated. Such a model constitutes a potential basis for the efficient design and optimization of multidimensional sensors. (c) 2006 Optical Society of America.

    Journal Title

    Applied Optics

    Volume

    45

    Issue/Number

    33

    Publication Date

    1-1-2006

    Document Type

    Article

    Language

    English

    First Page

    8419

    Last Page

    8423

    WOS Identifier

    WOS:000242196700004

    ISSN

    1559-128X

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