Relative intensity noise characteristics of frequency stabilised grating-coupled modelocked semiconductor laser

    Authors

    W. Lee; M. T. Choi; H. Izadpanah;R. J. Delfyett

    Comments

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    Abbreviated Journal Title

    Electron. Lett.

    Keywords

    PHASE; Engineering, Electrical & Electronic

    Abstract

    Relative intensity noise (RfN) characteristics of a frequency stabilised grating-coupled modelocked semiconductor laser (MSL) have been experimentally investigated. Reported is the first measurement, to the authors' knowledge, of general RIN characteristics as well as RIN reduction in the frequency stabilised MSL system showing the relationship between RIN and mode coherency in the MSL.

    Journal Title

    Electronics Letters

    Volume

    42

    Issue/Number

    20

    Publication Date

    1-1-2006

    Document Type

    Article

    Language

    English

    First Page

    1156

    Last Page

    1157

    WOS Identifier

    WOS:000241715800018

    ISSN

    0013-5194

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