Localized measurement of the optical thickness of a transparent window: application to the study of the photosensitivity of organic polymers

    Authors

    J. Lumeau;M. Lequime

    Comments

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    Abbreviated Journal Title

    Appl. Optics

    Keywords

    LOW-COHERENCE INTERFEROMETRY; Optics

    Abstract

    The development of an optical setup that permits us to carry out high-resolution mappings of the absolute optical thickness of plane-parallel transparent windows is described. This measurement is based on the recording and processing of the spectral transmission of the wafer between 1520 and 1570 nm and has a relative precision better than 10(-6). Hence it is used for the characterization of the photosensitivity of two organic photopolymers (cationic ring opening polymer and poly(methylmethacrylate)). The refractive index change dynamics for both materials and the spontaneous evolution of the optical thickness are demonstrated. (C) 2006 Optical Society of America.

    Journal Title

    Applied Optics

    Volume

    45

    Issue/Number

    24

    Publication Date

    1-1-2006

    Document Type

    Article

    Language

    English

    First Page

    6099

    Last Page

    6105

    WOS Identifier

    WOS:000239859400007

    ISSN

    1559-128X

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