Computer vision for nanoscale imaging

    Authors

    E. Ribeiro;M. Shah

    Comments

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    Abbreviated Journal Title

    Mach. Vis. Appl.

    Keywords

    AUTOMATIC PARTICLE-DETECTION; ELECTRON-MICROSCOPE TOMOGRAPHY; CARBON; NANOTUBES; ANISOTROPIC DIFFUSION; CAMERA CALIBRATION; AUGMENTED REALITY; NATURAL IMAGES; TRACKING; MICROGRAPHS; RESOLUTION; Computer Science, Artificial Intelligence; Computer Science, ; Cybernetics; Engineering, Electrical & Electronic

    Abstract

    The main goal of Nanotechnology is to analyze and understand the properties of matter at the atomic and molecular level. Computer vision is rapidly expanding into this new and exciting field of application, and considerable research efforts are currently being spent on developing new image-based characterization techniques to analyze nanoscale images. Nanoscale characterization requires algorithms to perform image analysis under extremely challenging conditions such as low signal-to-noise ratio and low resolution. To achieve this, nanotechnology researchers require imaging tools that are able to enhance images, detect objects and features, reconstruct 3D geometry, and tracking. This paper reviews current advances in computer vision and related areas applied to imaging nanoscale objects. We categorize the algorithms, describe their representative methods, and conclude with several promising directions of future investigation.

    Journal Title

    Machine Vision and Applications

    Volume

    17

    Issue/Number

    3

    Publication Date

    1-1-2006

    Document Type

    Article

    Language

    English

    First Page

    147

    Last Page

    162

    WOS Identifier

    WOS:000239036900001

    ISSN

    0932-8092

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