Abbreviated Journal Title
Appl. Phys. Lett.
Keywords
PERFECT-LENS; OPTICS; Physics, Applied
Abstract
Frequency dependent near-field scanning optical microscopy (NSOM) measurements of plasmon-mediated near-field focusing using a 50 nm thick Au film are presented. In these studies the tip aperture of a NSOM probe acts as a localized light source, while the near-field image formed by the metal lens is detected in situ using nanoscale scatterers placed in the image plane. By scanning the relative position of object and probe, the near-field image generated by the lens is resolved. NSOM scans performed at different illumination frequencies reveal an optimum near-field image quality at frequencies close to the surface plasmon resonance frequency.
Journal Title
Applied Physics Letters
Volume
89
Issue/Number
19
Publication Date
1-1-2006
Document Type
Article
DOI Link
Language
English
First Page
3
WOS Identifier
ISSN
0003-6951
Recommended Citation
Webb-Wood, G.; Ghoshal, A.; and Kik, P. G., "In situ experimental study of a near-field lens at visible frequencies" (2006). Faculty Bibliography 2000s. 6702.
https://stars.library.ucf.edu/facultybib2000/6702
Comments
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