Authors

B. Yao; R. V. Petrova; R. R. Vanfleet;K. R. Coffey

Comments

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Abbreviated Journal Title

J. Appl. Phys.

Keywords

THIN-FILMS; STOICHIOMETRY; Physics, Applied

Abstract

The loss of Fe due to oxidation or diffusion into the substrate can prevent the successful preparation of well-ordered, stoichiometric, FePt nanoparticles. In this work we report the composition changes during annealing observed for small ( < 10 nm) FePt nanoparticles on thermally grown SiO2 layers on Si wafer substrates. Additionally, we describe the use of a controlled reducing gas mixture, Ar+H-2+H2O, to reduce the loss of Fe.

Journal Title

Journal of Applied Physics

Volume

99

Issue/Number

8

Publication Date

1-1-2006

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000237404200282

ISSN

0021-8979

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