Complex refractive indices of Cd(x)Zn(1-x)Othin films grown by molecular beam epitaxy

    Authors

    J. W. Mares; M. Falanga; W. R. Folks; G. Boreman; A. Osinsky; B. Hertog; J. Q. Xie;W. V. Schoenfeld

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abstract

    The complex refractive indices of Cd (x) Zn1-x O thin films were determined by transmission spectrophotometry. Transmission spectra were modeled from 375 nm to 800 nm for samples having cadmium concentrations ranging from 2% to 77%. The transparent and absorptive regimes were fitted separately by Sellmeier and Forouhi-Bloomer models, respectively. Real refractive indices of Cd (x) Zn1-x O shift to higher values in the transparent region and the optical absorption edge shifts to longer wavelengths with increasing cadmium concentration. Spectroscopic ellipsometry was carried out on one sample from lambda = 190 nm to 1.8 mu m. Comparison between the two methods shows that the results are in general agreement.

    Journal Title

    Journal of Electronic Materials

    Volume

    37

    Issue/Number

    11

    Publication Date

    1-1-2008

    Document Type

    Article

    First Page

    1665

    Last Page

    1673

    WOS Identifier

    WOS:000259697800003

    ISSN

    0361-5235

    Share

    COinS