Title

Accurate determination of the optical performances of antireflective coatings by low coherence reflectometry

Authors

Authors

M. Lequime;J. Lumeau

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Appl. Optics

Keywords

TOMOGRAPHY; THICKNESS; PHASE; Optics

Abstract

We propose to use optical low coherence reflectometry to measure the reflectance of both faces of a plane substrate with one side coated in antireflective layers. We identify, through a detailed theoretical analysis, the optimum configuration and evaluate the expected sensitivity and accuracy of some realistic examples. Finally, we experimentally demonstrate the ability of this method to quantify reflection coefficients as low as 5 x 10(-7). That way, an accurate characterization of the performances, at 1550 nm, of antireflective coatings deposited on various plane substrates is achieved. (C) 2007 Optical Society of America.

Journal Title

Applied Optics

Volume

46

Issue/Number

23

Publication Date

1-1-2007

Document Type

Article

DOI Link

http://dx.doi.org/10.1364/ao.46.005635

Language

English

First Page

5635

Last Page

5644

WOS Identifier

WOS:000249315300013

ISSN

1559-128X

Recommended Citation

"Accurate determination of the optical performances of antireflective coatings by low coherence reflectometry" (2007). Faculty Bibliography 2000s. 7347.
https://stars.library.ucf.edu/facultybib2000/7347