Accurate determination of the optical performances of antireflective coatings by low coherence reflectometry

    Authors

    M. Lequime;J. Lumeau

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Appl. Optics

    Keywords

    TOMOGRAPHY; THICKNESS; PHASE; Optics

    Abstract

    We propose to use optical low coherence reflectometry to measure the reflectance of both faces of a plane substrate with one side coated in antireflective layers. We identify, through a detailed theoretical analysis, the optimum configuration and evaluate the expected sensitivity and accuracy of some realistic examples. Finally, we experimentally demonstrate the ability of this method to quantify reflection coefficients as low as 5 x 10(-7). That way, an accurate characterization of the performances, at 1550 nm, of antireflective coatings deposited on various plane substrates is achieved. (C) 2007 Optical Society of America.

    Journal Title

    Applied Optics

    Volume

    46

    Issue/Number

    23

    Publication Date

    1-1-2007

    Document Type

    Article

    Language

    English

    First Page

    5635

    Last Page

    5644

    WOS Identifier

    WOS:000249315300013

    ISSN

    1559-128X

    Share

    COinS