Title

Rigorous electromagnetic analysis of volumetrically complex media using the slice absorption method

Authors

Authors

R. C. Rumpf; A. Tal;S. M. Kuebler

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

J. Opt. Soc. Am. A-Opt. Image Sci. Vis.

Keywords

PHOTONIC BAND STRUCTURES; COUPLED-WAVE ANALYSIS; EFFICIENT; IMPLEMENTATION; HOLOGRAPHIC LITHOGRAPHY; PERIODIC STRUCTURES; MAXWELLS; EQUATIONS; NEAR-FIELD; GRATINGS; FABRICATION; CRYSTALS; Optics

Abstract

There is tremendous demand for numerical methods to perform rigorous analysis of devices that are both large scale and complex throughout their volume. This can arise when devices must be considered with realistic geometry or when they contain artificial materials such as photonic crystals, left-handed materials, nanoparticles, or other metamaterials. The slice absorption method (SAM) was developed to address this need. The method is fully numerical and able to break large problems down into small pieces, or slices, using matrix division or Gaussian elimination instead of eigensystern computations and scattering matrix manipulations. In these regards, the SAM is an attractive alternative to popular techniques like the finite-difference time domain method, rigorous coupled-wave analysis, and the transfer matrix method. To demonstrate the utility of the SAM and benchmark its accuracy, reflection was simulated for a photonic crystal fabricated in SU-8 by multiphoton direct laser writing. Realistic geometry was incorporated into the model by simulating the microfabrication. process, which yielded simulation results that matched experimental measurements remarkably well. (c) 2007 Optical Society of America.

Journal Title

Journal of the Optical Society of America a-Optics Image Science and Vision

Volume

24

Issue/Number

10

Publication Date

1-1-2007

Document Type

Article

Language

English

First Page

3123

Last Page

3134

WOS Identifier

WOS:000250682300021

ISSN

1084-7529

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