Design and demonstration of an infrared meanderline phase retarder

    Authors

    J. S. Tharp; B. A. Lail; B. A. Munk;G. D. Boreman

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Trans. Antennas Propag.

    Keywords

    frequency selective surfaces; infrared measurements; polarization; LINE POLARIZER; Engineering, Electrical & Electronic; Telecommunications

    Abstract

    We compare design and measurements for a single-layer meanderline quarter-wave phase retarder, operating across the wavelength range from 8 to 12 micrometers (25 to 37.5 THz) in the infrared. The structure was fabricated using direct-write electron-beam lithography. With measured frequency-dependent material properties incorporated into a periodic-moment-method model, reasonable agreement is obtained for the spectral dependence of axial ratio and phase delay. As expected from theory, the single-layer meanderline design has relatively low throughput (23%), but with extension to multiple-layer designs, the meanderline approach offers significant potential benefits as compared to conventional birefringent crystalline waveplates in terms of spectral bandwidth, angular bandwidth, and cost. Simple changes in the lithographic geometry will allow designs to be developed for specific phase retardations over specified frequency ranges in the infrared, terahertz, or millimeter-wave bands, where custom-designed, waveplates are not commercially available.

    Journal Title

    Ieee Transactions on Antennas and Propagation

    Volume

    55

    Issue/Number

    11

    Publication Date

    1-1-2007

    Document Type

    Article

    Language

    English

    First Page

    2983

    Last Page

    2988

    WOS Identifier

    WOS:000250929600006

    ISSN

    0018-926X

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