Bicrystal growth and characterization of copper twist grain boundaries

    Authors

    S. M. Schwarz; E. C. Houge; L. A. Giannuzzi;A. H. King

    Abbreviated Journal Title

    J. Cryst. Growth

    Keywords

    Crystallography; Materials Science, Multidisciplinary; Physics, Applied

    Abstract

    Copper bicrystals with twist character were grown using the vertical Bridgman technique. Cu bicrystals were grown such that the grain boundary in each sample had a nominal twist misorientation consisting of either a low angle (10 degrees), a special angle (Sigma5 = 36.87 degrees), or a high angle (45 degrees). The grain boundary plane in all cases was (1 0 0). The grain boundaries were grown using single-crystal seeds that were oriented to within +/-0.5 using the Laue buck-reflection X-ray diffraction method. The misorientation of each twist boundary was characterized using electron backscattering diffraction patterns in a scanning electron microscope. All grain boundary misorientations were determined to be within the limits defined by the Brandon criterion. (C) 2001 Published by Elsevier Science B.V.

    Journal Title

    Journal of Crystal Growth

    Volume

    222

    Issue/Number

    1-2

    Publication Date

    1-1-2001

    Document Type

    Article

    Language

    English

    First Page

    392

    Last Page

    398

    WOS Identifier

    WOS:000166502600045

    ISSN

    0022-0248

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