Characterization challenges for nanomaterials

    Authors

    D. R. Baer; J. E. Amonette; M. H. Engelhard; D. J. Gaspar; A. S. Karakoti; S. Kuchibhatla; P. Nachimuthu; J. T. Nurmi; Y. Qiang; V. Sarathy; S. Seal; A. Sharma; P. G. Tratnyek;C. M. Wang

    Comments

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    Abbreviated Journal Title

    Surf. Interface Anal.

    Keywords

    nanomaterials; characterization; surface analysis; XPS; XRD; TEM; IRON-OXIDE NANOPARTICLES; CORE-SHELL NANOCLUSTERS; MAGNETIC-PROPERTIES; CARBON NANOTUBES; FE NANOPARTICLES; QUANTUM DOTS; PARTICLES; NANOCRYSTALS; SPECTROSCOPY; TEMPERATURE; Chemistry, Physical

    Abstract

    Nanostructured materials are increasingly subject to nearly every type of chemical and physical analysis possible. Due to their small sizes, there is a significant focus on tools with high spatial resolution. It is also natural to characterize nanomaterials using tools designed to analyze surfaces, because of their high surface area. Regardless of the approach, nanostructured materials present a variety of obstacles to adequate, useful, and needed analysis. Case studies of measurements on ceria and iron metal-core/oxide-shell nanoparticles are used to introduce some of the issues that frequently need to be addressed during analysis of nanostructured materials. We use a combination of tools for routine analysis including X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), and x-ray diffraction (XRD) and apply several other methods as needed to obtain essential information. The examples provide an introduction to other issues and complications associated with the analysis of nanostructured materials including particle stability, probe effects, environmental effects, specimen handling, surface coating, contamination, and time. Copyright (c) 2008 John Wiley & Sons, Ltd.

    Journal Title

    Surface and Interface Analysis

    Volume

    40

    Issue/Number

    3-4

    Publication Date

    1-1-2008

    Document Type

    Article

    Language

    English

    First Page

    529

    Last Page

    537

    WOS Identifier

    WOS:000255486200090

    ISSN

    0142-2421

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