Title

Evaluating MOSFET harmonic distortion by successive integration of the I-V characteristics

Authors

Authors

R. Salazar; A. Ortiz-Conde; F. J. Garcia-Sancliez; C. S. Ho;J. J. Liou

Comments

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Abbreviated Journal Title

Solid-State Electron.

Keywords

integral non-linearity function; harmonic distortion; THD; IP2; IP3; SOIFD TRANSISTORS; Engineering, Electrical & Electronic; Physics, Applied; Physics, ; Condensed Matter

Abstract

A new method, which we have named "Full Successive Integrals Method" (FSIM), is presented for evaluating harmonic distortion of semiconductor devices from their static I-V characteristics. To assess the method's applicability, it is used to calculate the harmonic distortion components (H.) from the measured output characteristics of several experimental n-MOSFETs with various channel lengths. The resulting values of the harmonic components are compared to, and match very well, those obtained through conventional Fourier analysis techniques. The proposed method's main appeal is that its implementation is fast and straight forward, and inherently filters out measurement noise. It can be used to calculate distortion harmonics for any desired input level, without having to deal with AC signals or having to perform lengthy Fourier type analysis. (C) 2008 Elsevier Ltd. All rights reserved.

Journal Title

Solid-State Electronics

Volume

52

Issue/Number

7

Publication Date

1-1-2008

Document Type

Article

Language

English

First Page

1092

Last Page

1098

WOS Identifier

WOS:000257972500018

ISSN

0038-1101

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