Abbreviated Journal Title
Opt. Express
Keywords
WAVE-FORM GENERATION; LASER; PRECISION; Optics
Abstract
We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be similar to 1.47 GHz for the particular etalon that was used.
Journal Title
Optics Express
Volume
19
Issue/Number
18
Publication Date
1-1-2011
Document Type
Article
Language
English
First Page
16851
Last Page
16865
WOS Identifier
ISSN
1094-4087
Recommended Citation
Akbulut, M.; Davila-Rodriguez, J.; Ozdur, Ibrahim; Quinlan, F.; Ozharar, S.; Hoghooghi, N.; and Delfyett, P. J., "Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb" (2011). Faculty Bibliography 2010s. 1044.
https://stars.library.ucf.edu/facultybib2010/1044
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