Authors

D. C. Kohlgraf-Owens; S. Sukhov;A. Dogariu

Comments

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Abbreviated Journal Title

Phys. Rev. A

Keywords

ATOMIC-FORCE MICROSCOPY; DISTANCE; Optics; Physics, Atomic, Molecular & Chemical

Abstract

We demonstrate that the mechanical action of light manifests itself in the perceived topography measured with a scanning probe microscope. This modality of sensing optically induced forces opens up possibilities to quantify properties of electromagnetic fields.

Journal Title

Physical Review A

Volume

84

Issue/Number

1

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

4

WOS Identifier

WOS:000293300900003

ISSN

1050-2947

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