Title

Study of Organic Thin-Film Transistors Under Electrostatic Discharge Stresses

Authors

Authors

W. Liu; J. J. Liou; K. Kuribara; K. Fukuda; T. Sekitani; T. Someya; J. Chung; Y. H. Jeong; Z. X. Wang;C. L. Lin

Comments

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Abbreviated Journal Title

IEEE Electron Device Lett.

Keywords

Degradation; electrostatic discharge (ESD); organic thin-film transistor; (OTFT); Engineering, Electrical & Electronic

Abstract

Low-voltage pentacene-based organic thin-film transistors (OTFTs) are characterized for the first time under the electrostatic discharge (ESD) stresses. The measurements are conducted using the transmission line pulsing (TLP) tester which generates the human body model equivalent pulses. The ESD behaviors and tolerances of OTFTs having different dimensions and gate biasing conditions are investigated. OTFT's failure mechanism and dc performance degradation due to the ESD stresses are also studied.

Journal Title

Ieee Electron Device Letters

Volume

32

Issue/Number

7

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

967

Last Page

969

WOS Identifier

WOS:000292165200045

ISSN

0741-3106

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