Abbreviated Journal Title
Acta Phys. Pol. A
Keywords
Silicon; Cr; Physics, Multidisciplinary
Abstract
It is known that processing of silicon implanted with vanadium, Si:V, at high temperature-pressure, HT-HP, can lead to magnetic ordering within the V-enriched area. New data concerning structure of Si:V (prepared using V(+) doses, D = (1-5) x 10(15) cm(-2), and energy, E = 200 keV), as implanted and processed for up to 10 h at HT < = 1400 K under enhanced hydrostatic pressure, HP < = 1.1 GPa, are presented. In effect of implantation, amorphous (a-Si) area is produced near range of implanted species. Transmission electron microscopy, secondary ion mass spectrometry, X-ray, and synchrotron methods were used for sample characterisation. At HT-HP the a-Si layer is subjected to solid phase epitaxial re-growth. Depending on HP, distinct solid phase epitaxial re-growth and formation of VSi(2) are observed at HT > = 720 K. HP applied at processing results in the improved solid phase epitaxial re-growth in Si:V. This can be related, among others, to the effect of HP on diffusivity of V(+) and of implantation-induced point defects. Our results can be useful for development of the new family of diluted magnetic semiconductors.
Journal Title
Acta Physica Polonica A
Volume
120
Issue/Number
1
Publication Date
1-1-2011
Document Type
Article; Proceedings Paper
Language
English
First Page
196
Last Page
199
WOS Identifier
ISSN
0587-4246
Recommended Citation
Misiuk, A.; Wierzchowski, W.; Wieteska, K.; Barcz, A.; Bak-Misiuk, J.; Chow, L.; Vanfleet, R.; and Prujszczyk, M., "Properties of Si:V Annealed under Enhanced Hydrostatic Pressure" (2011). Faculty Bibliography 2010s. 1674.
https://stars.library.ucf.edu/facultybib2010/1674
Comments
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