Abbreviated Journal Title
Opt. Express
Keywords
OPTICAL-PERFORMANCE; FINISH; Optics
Abstract
The light scattering of rough metallic surfaces with roughness levels ranging from a few to several hundred nanometers is modeled and compared to experimental data. Different modeling approaches such as the classical Rayleigh-Rice vector perturbation theory and the new Generalized Harvey-Shack theory are used and critically assessed with respect to ranges of validity, accuracy, and practicability. Based on theoretical calculations and comparisons with Rigorous Coupled Wave Analysis for sinusoidal phase gratings, it is demonstrated that the approximate scatter models yield surprisingly accurate results and at the same time provide insight into light scattering phenomena. For stochastically rough metal surfaces, the predicted angles resolved scattering is compared to experimental results at 325 nm, 532 nm, and 1064 nm. In addition, the possibilities of retrieving roughness information from measured scattering data for different roughness regimes are discussed.
Journal Title
Optics Express
Volume
19
Issue/Number
10
Publication Date
1-1-2011
Document Type
Article
Language
English
First Page
9820
Last Page
9835
WOS Identifier
ISSN
1094-4087
Recommended Citation
Schröder, Sven; Duparré, Angela; Coriand, Luisa; Tünnermann, Andreas; Penalver, Dayana H.; and Harvey, James E., "Modeling of light scattering in different regimes of surface roughness" (2011). Faculty Bibliography 2010s. 1871.
https://stars.library.ucf.edu/facultybib2010/1871
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