Aluminum Impurity Diffusion in Magnesium

    Authors

    S. Brennan; A. P. Warren; K. R. Coffey; N. Kulkarni; P. Todd; M. Kilmov;Y. Sohn

    Comments

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    Abbreviated Journal Title

    J. Phase Equilib. Diffus.

    Keywords

    aluminum; impurity diffusivity; magnesium; secondary ion mass; spectroscopy; ALLOYS; Chemistry, Physical; Materials Science, Multidisciplinary; Metallurgy &; Metallurgical Engineering

    Abstract

    The diffusion of Al in polycrystalline Mg (99.9%) was studied via depth profiling with secondary ion mass spectrometry in the temperature range of 573-673 K, utilizing the thin film method and thin film solution to the diffusion equation. Multiple samples with multiple depth profiles on each sample were obtained to determine statistically confident coefficients with a maximum standard deviation between measurements of 16%. The activation energy and pre-exponential factor of Al impurity diffusion in Mg were determined as 155 kJ/mole and 3.9 x 10(-3) m(2)/s, respectively. The Mg substrates have a small grain size (similar to 10 mu m) and therefore some contributions from grain boundary diffusion are expected in the measurements. Sputter roughening during depth profiling, which is inherent to the SIMS process, also contributes to the measured diffusion coefficient, especially in samples with smaller grain sizes.

    Journal Title

    Journal of Phase Equilibria and Diffusion

    Volume

    33

    Issue/Number

    2

    Publication Date

    1-1-2012

    Document Type

    Article

    Language

    English

    First Page

    121

    Last Page

    125

    WOS Identifier

    WOS:000302419300008

    ISSN

    1547-7037

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