Metrics, Metrics, Metrics, Part 2: Universal Metrics?

    Authors

    R. R. Hoffman; P. A. Hancock;J. M. Bradshaw

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Intell. Syst.

    Keywords

    Computer Science, Artificial Intelligence; Engineering, Electrical &; Electronic

    Journal Title

    Ieee Intelligent Systems

    Volume

    25

    Issue/Number

    6

    Publication Date

    1-1-2010

    Document Type

    Article

    Language

    English

    First Page

    93

    Last Page

    97

    WOS Identifier

    WOS:000285280200016

    ISSN

    1541-1672

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