Authors

M. R. Ferdinandus; M. Reichert; T. R. Ensley; H. H. Hu; D. A. Fishman; S. Webster; D. J. Hagan;E. W. Van Stryland

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Abbreviated Journal Title

Opt. Mater. Express

Keywords

OPTICAL NONLINEARITIES; PERTURBATION THEORY; SINGLE BEAM; 3RD-ORDER; SILICON; DESIGN; SYSTEM; Materials Science, Multidisciplinary; Optics

Abstract

We present a technique in which small solute nonlinearities may be extracted from large solvent signals by performing simultaneous Z-scans on two samples (solvent and solution). By using a dual-arm Z-scan apparatus with identical arms, fitting error in determining the solute nonlinearity is reduced because the irradiance fluctuations are correlated for both the solvent and solution measurements. To verify the sensitivity of this technique, the dispersion of nonlinear refraction of a squaraine molecule is measured. Utilizing this technique allows for the effects of the solvent n(2) to be effectively eliminated, thus overcoming a longstanding problem in nonlinear optical characterization of organic dyes.

Journal Title

Optical Materials Express

Volume

2

Issue/Number

12

Publication Date

1-1-2013

Document Type

Article

Language

English

First Page

1776

Last Page

1790

WOS Identifier

WOS:000311952200011

ISSN

2159-3930

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