Authors

D. Joung;S. I. Khondaker

Comments

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Abbreviated Journal Title

Phys. Rev. B

Keywords

ELECTRONIC TRANSPORT-PROPERTIES; X-RAY PHOTOELECTRON; DISORDERED; SYSTEMS; GRAPHITE OXIDE; COULOMB GAP; CONDUCTIVITY; FILMS; NANOPARTICLES; TRANSITION; MECHANISM; Physics, Condensed Matter

Abstract

We investigate the low-temperature electron transport properties of chemically reduced graphene oxide (RGO) sheets with different carbon sp(2) fractions of 55% to 80%. We show that in the low-bias (Ohmic) regime, the temperature (T) dependent resistance (R) of all the devices follow Efros-Shklovskii variable range hopping (ES-VRH) R similar to exp[(T-ES/T)(1/2)] with T-ES decreasing from 3.1 x 10(4) to 0.42 x 10(4) K and electron localization length increasing from 0.46 to 3.21 nm with increasing sp(2) fraction. From our data, we predict that for the temperature range used in our study, Mott-VRH may not be observed even at 100% sp(2) fraction samples due to residual topological defects and structural disorders. From the localization length, we calculate a band-gap variation of our RGO from 1.43 to 0.21 eV with increasing sp(2) fraction from 55 to 80%, which agrees remarkably well with theoretical predictions. We also show that, in the high bias non-Ohmic regime at low temperature, the hopping is field driven and the data follow R similar to exp[(E0/E)(1/2)] providing further evidence of ES-VRH. DOI: 10.1103/PhysRevB.86.235423

Journal Title

Physical Review B

Volume

86

Issue/Number

23

Publication Date

1-1-2012

Document Type

Article

Language

English

First Page

8

WOS Identifier

WOS:000312365100006

ISSN

1098-0121

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