Abbreviated Journal Title
Appl. Phys. Lett.
Keywords
MAGNESIUM OXIDE; REFLECTANCE; SPECTROSCOPY; DISPERSION; SCATTERING; SPECTRA; Physics, Applied
Abstract
The role of crystal coherence length on the infrared optical response of MgO thin films was investigated with regard to Reststrahlen band photon-phonon coupling. Preferentially (001)-oriented sputtered and evaporated ion-beam assisted deposited thin films were prepared on silicon and annealed to vary film microstructure. Film crystalline coherence was characterized by x-ray diffraction line broadening and transmission electron microscopy. The infrared dielectric response revealed a strong dependence of dielectric resonance magnitude on crystalline coherence. Shifts to lower transverse optical phonon frequencies were observed with increased crystalline coherence. Increased optical phonon damping is attributed to increasing granularity and intergrain misorientation.
Journal Title
Applied Physics Letters
Volume
97
Issue/Number
19
Publication Date
1-1-2010
Document Type
Article
DOI Link
Language
English
First Page
3
WOS Identifier
ISSN
0003-6951
Recommended Citation
Ihlefeld, J. F.; Ginn, J. C.; Shelton, D. J.; Matias, V.; Rodriguez, M. A.; Kotula, P. G.; Carroll, J. F. III; Boreman, G. D.; Clem, P. G.; and Sinclair, M. B., "Crystal coherence length effects on the infrared optical response of MgO thin films" (2010). Faculty Bibliography 2010s. 286.
https://stars.library.ucf.edu/facultybib2010/286
Comments
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