Discrimination of field components in optical probe microscopy

    Authors

    D. C. Kohlgraf-Owens; S. Sukhov;A. Dogariu

    Comments

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    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    Optics

    Abstract

    We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity. (c) 2012 Optical Society of America

    Journal Title

    Optics Letters

    Volume

    37

    Issue/Number

    17

    Publication Date

    1-1-2012

    Document Type

    Article

    Language

    English

    First Page

    3606

    Last Page

    3608

    WOS Identifier

    WOS:000308595300044

    ISSN

    0146-9592

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