Title
Discrimination of field components in optical probe microscopy
Abbreviated Journal Title
Opt. Lett.
Keywords
Optics
Abstract
We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity. (c) 2012 Optical Society of America
Journal Title
Optics Letters
Volume
37
Issue/Number
17
Publication Date
1-1-2012
Document Type
Article
Language
English
First Page
3606
Last Page
3608
WOS Identifier
ISSN
0146-9592
Recommended Citation
"Discrimination of field components in optical probe microscopy" (2012). Faculty Bibliography 2010s. 2875.
https://stars.library.ucf.edu/facultybib2010/2875
Comments
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