Title

RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments

Authors

Authors

H. D. Yen; J. S. Yuan; R. L. Wang; G. W. Huang; W. K. Yeh;F. S. Huang

Comments

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Abbreviated Journal Title

Microelectron. Reliab.

Keywords

INTERFACE-TRAP GENERATION; HOT-CARRIER DEGRADATION; LOW-FREQUENCY NOISE; TRANSFORMER-FEEDBACK; MOS-TRANSISTORS; SOFT BREAKDOWN; PERFORMANCE; MOSFETS; TECHNOLOGY; AMPLIFIERS; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied

Abstract

A current reused LC voltage-controlled oscillator (VCO) operating at 2.4 GHz range has been designed and fabricated. The measured output current, phase noise, and oscillation frequency after RF stress show significant parameter shifts from their fresh circuit condition. Impact of hot carrier effect and negative bias temperature instability on the VCO's phase noise is discussed. (C) 2012 Elsevier Ltd. All rights reserved.

Journal Title

Microelectronics Reliability

Volume

52

Issue/Number

11

Publication Date

1-1-2012

Document Type

Article

Language

English

First Page

2655

Last Page

2659

WOS Identifier

WOS:000310767400024

ISSN

0026-2714

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