Title

Simultaneous measurement of tracer and interdiffusion coefficients: an isotopic phenomenological diffusion formalism for the binary alloy

Authors

Authors

I. V. Belova; N. S. Kulkarni; Y. H. Sohn;G. E. Murch

Comments

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Abbreviated Journal Title

Philos. Mag.

Keywords

diffusion; SIMS; theoretical; VACANCIES; TRANSPORT; SOLIDS; Materials Science, Multidisciplinary; Mechanics; Metallurgy &; Metallurgical Engineering; Physics, Applied; Physics, Condensed Matter

Abstract

In this paper, a new development of the classic Onsager phenomenological formalism is derived using relations based on linear response theory. The development concerns the correct description of the fluxes of the atomic isotopes. The resulting expressions in the laboratory frame are surprisingly simple and consist of terms coming from the standard interdiffusion expressions and from Fick's first law, where the tracer diffusion coefficient is involved thus providing a better understanding of the relationship between the two approaches - Fick's first law and the Onsager phenomenological formalism. From an experimental application perspective, the new development is applied to the binary alloy case. The formalism provides the means to obtain the interdiffusion coefficient and tracer diffusion coefficients simultaneously from analysis of the interdiffusion composition profiles in a single experiment.

Journal Title

Philosophical Magazine

Volume

93

Issue/Number

26

Publication Date

1-1-2013

Document Type

Article

Language

English

First Page

3515

Last Page

3526

WOS Identifier

WOS:000323813300005

ISSN

1478-6435

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