Simultaneous measurement of tracer and interdiffusion coefficients: an isotopic phenomenological diffusion formalism for the binary alloy

    Authors

    I. V. Belova; N. S. Kulkarni; Y. H. Sohn;G. E. Murch

    Comments

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    Abbreviated Journal Title

    Philos. Mag.

    Keywords

    diffusion; SIMS; theoretical; VACANCIES; TRANSPORT; SOLIDS; Materials Science, Multidisciplinary; Mechanics; Metallurgy &; Metallurgical Engineering; Physics, Applied; Physics, Condensed Matter

    Abstract

    In this paper, a new development of the classic Onsager phenomenological formalism is derived using relations based on linear response theory. The development concerns the correct description of the fluxes of the atomic isotopes. The resulting expressions in the laboratory frame are surprisingly simple and consist of terms coming from the standard interdiffusion expressions and from Fick's first law, where the tracer diffusion coefficient is involved thus providing a better understanding of the relationship between the two approaches - Fick's first law and the Onsager phenomenological formalism. From an experimental application perspective, the new development is applied to the binary alloy case. The formalism provides the means to obtain the interdiffusion coefficient and tracer diffusion coefficients simultaneously from analysis of the interdiffusion composition profiles in a single experiment.

    Journal Title

    Philosophical Magazine

    Volume

    93

    Issue/Number

    26

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    3515

    Last Page

    3526

    WOS Identifier

    WOS:000323813300005

    ISSN

    1478-6435

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