Transmission electron microscopy observations on the phase composition and microstructure of the oxidation scale grown on as-polished and yttrium-implanted beta-NiAl
Abbreviated Journal Title
Surf. Coat. Technol.
Keywords
beta-NiAl; Al(2)O(3); High temperature oxidation; Y-implantation; Phase; transformation; Transmission electron microscopy; THERMAL BARRIER COATINGS; ALUMINA FORMERS; ALLOYS; ALPHA-AL2O3; ADDITIONS; MECHANISM; Materials Science, Coatings & Films; Physics, Applied
Abstract
Phase transformations and microstructural evolution of thermally grown oxide scale on polycrystalline beta-NiAl at 1100 degrees C up to 6 h, with and without (e.g., as-polished) yttrium implantation, were examined by glancing angle X-ray diffraction, photostimulated luminescence, scanning and transmission electron microscopy. Site-specific TEM specimens were prepared by using focused ion beam in-situ lift-out technique. The oxide scale developed on as-polished beta-NiAl consisted of the islands of 390 nm-thick flat regions (e.g., patches) in 916 nm-thick scales. Regardless of microstructure, the oxide scale consisted of alpha-Al(2)O(3) with very little trace of theta-Al(2)O(3), and had uniform compressive residual stress. The oxide scale on Y-implanted beta-NiAl had a two-layer microstructure: the outer layer was mainly alpha-Al(2)O(3) and the inner layer was made up of alpha-, delta-, and theta-Al(2)O(3) phases. Clearly, the Y addition retarded the theta-to-alpha Al(2)O(3) phase transformation. The oxide scale on Y-implanted beta-NiAl, in general, consisted of a 722 nm-thick layer with islands of 470 nm-thick patched regions, some of which contained Y-rich nodules that protruded with thickness up to 1200 nm. Except for islands of patch-regions, the oxide scale developed on Y-implanted beta-NiAl was thinner (722 nm) than that on as-polished beta-NiAl (916 nm). (C) 2010 Elsevier B.V. All rights reserved.
Journal Title
Surface & Coatings Technology
Volume
205
Issue/Number
5
Publication Date
1-1-2010
Document Type
Article; Proceedings Paper
Language
English
First Page
1206
Last Page
1210
WOS Identifier
ISSN
0257-8972
Recommended Citation
"Transmission electron microscopy observations on the phase composition and microstructure of the oxidation scale grown on as-polished and yttrium-implanted beta-NiAl" (2010). Faculty Bibliography 2010s. 38.
https://stars.library.ucf.edu/facultybib2010/38
Accessibility Statement
This item was created or digitized prior to April 24, 2027, or is a reproduction of legacy media created before that date. It is preserved in its original, unmodified state specifically for research, reference, or historical recordkeeping. In accordance with the ADA Title II Final Rule, the University Libraries provides accessible versions of archival materials upon request. To request an accommodation for this item, please submit an accessibility request form.
Comments
Authors: contact us about adding a copy of your work at [email protected]