Title
Field-effect piezoresistors for vibration detection of nanobeams by using monolithically integrated MOS capacitors
Abbreviated Journal Title
J. Micromech. Microeng.
Keywords
NANOMECHANICAL RESONATOR; ETCH-STOP; DISPLACEMENT; CANTILEVERS; QUANTUM; MOTION; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Instruments & Instrumentation; Materials Science, Multidisciplinary; Mechanics
Abstract
A novel piezoresistive sensing method is presented herein for the detection of nanobeam resonator based on a monolithically integrated MOS (metal-oxide-semiconductor) capacitor structure. The bottom layer of the nanobeam located beneath the MOS capacitor is utilized as a piezoresistor for the detection of internal stress resulting from nanobeam deformation, and therefore the challenging process of ultra-shallow junction doping is avoided. When a bias voltage applied on the MOS gate exceeds the threshold, the depletion layer width is built up to the maximum, and the piezoresistive cancellation effect beside the neutral plane is eliminated. Based on a conventional microelectromechanical (MEMS) process, an MOS capacitor is fabricated at the terminal of a double-clamped nanobeam with dimensions of 46 mu m x 7 mu m x 149 nm. The measured R-V curve of this MOS structure presents a 64.7 nm thick piezoresistor which closely agrees with the design. This double-clamped nanobeam is excited into mechanical resonance by mounting it on a piezoelectric ceramic, and the amplitude-frequency response is measured by a network analyzer. The measured resonant frequency is 3.97 MHz and the quality (Q)-factor is 82 in atmosphere environment. Besides, this piezoresistive sensing method is verified by a laser-Doppler vibrometry.
Journal Title
Journal of Micromechanics and Microengineering
Volume
23
Issue/Number
2
Publication Date
1-1-2013
Document Type
Article
Language
English
First Page
8
WOS Identifier
ISSN
0960-1317
Recommended Citation
"Field-effect piezoresistors for vibration detection of nanobeams by using monolithically integrated MOS capacitors" (2013). Faculty Bibliography 2010s. 3800.
https://stars.library.ucf.edu/facultybib2010/3800
Comments
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