A Portable High-Resolution Surface Measurement Device

    Authors

    C. M. Ihlefeld; B. M. Burns;R. C. Youngquist

    Comments

    Authors: contact us about adding a copy of your work at [email protected]

    Abbreviated Journal Title

    IEEE Trans. Instrum. Meas.

    Keywords

    Aerospace engineering; ergonomics; optical sensors; sensor systems; CONFOCAL MICROSCOPY; Engineering, Electrical & Electronic; Instruments & Instrumentation

    Abstract

    A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects.

    Journal Title

    Ieee Transactions on Instrumentation and Measurement

    Volume

    62

    Issue/Number

    1

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    205

    Last Page

    209

    WOS Identifier

    WOS:000312451500021

    ISSN

    0018-9456

    Share

    COinS
     

    Accessibility Statement

    This item was created or digitized prior to April 24, 2027, or is a reproduction of legacy media created before that date. It is preserved in its original, unmodified state specifically for research, reference, or historical recordkeeping. In accordance with the ADA Title II Final Rule, the University Libraries provides accessible versions of archival materials upon request. To request an accommodation for this item, please submit an accessibility request form.