A Portable High-Resolution Surface Measurement Device

    Authors

    C. M. Ihlefeld; B. M. Burns;R. C. Youngquist

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Trans. Instrum. Meas.

    Keywords

    Aerospace engineering; ergonomics; optical sensors; sensor systems; CONFOCAL MICROSCOPY; Engineering, Electrical & Electronic; Instruments & Instrumentation

    Abstract

    A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects.

    Journal Title

    Ieee Transactions on Instrumentation and Measurement

    Volume

    62

    Issue/Number

    1

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    205

    Last Page

    209

    WOS Identifier

    WOS:000312451500021

    ISSN

    0018-9456

    Share

    COinS