Title

A Portable High-Resolution Surface Measurement Device

Authors

Authors

C. M. Ihlefeld; B. M. Burns;R. C. Youngquist

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

IEEE Trans. Instrum. Meas.

Keywords

Aerospace engineering; ergonomics; optical sensors; sensor systems; CONFOCAL MICROSCOPY; Engineering, Electrical & Electronic; Instruments & Instrumentation

Abstract

A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects.

Journal Title

Ieee Transactions on Instrumentation and Measurement

Volume

62

Issue/Number

1

Publication Date

1-1-2013

Document Type

Article

Language

English

First Page

205

Last Page

209

WOS Identifier

WOS:000312451500021

ISSN

0018-9456

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