Spectroscopic ellipsometry on metal and metal-oxide multilayer hybrid plasmonic nanostructures

    Authors

    A. A. Khosroabadi; P. Gangopadhyay; B. Cocilovo; L. Makai; P. Basa; B. Duong; J. Thomas;R. A. Norwood

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    OPTICAL-PROPERTIES; THIN-FILMS; RESONANCE; Optics

    Abstract

    The effective medium approximation is used to determine the optical constants of novel silver (Ag)/indium-tin oxide (ITO) multilayer nanopillar structures within the 300-800 nm wavelength range. The structures are modeled as inclusions in air with the pillar volume fraction at 42.4%, agreeing with SEM images of the sample. The simulated reflection intensity of the nanopillars is much less than that of the planar reference sample and is a result of the small difference between the refractive index of the top effective medium layer and that of air. Furthermore, the minimum in the reflection at around 450 nm in the nanostructured sample is evidence of surface plasmon enhancement, indicating suitability for plasmonic applications. The simulated Brewster angle decreases in the pillar region, which is an indication of smaller effective refractive index. (C) 2013 Optical Society of America

    Journal Title

    Optics Letters

    Volume

    38

    Issue/Number

    19

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    3969

    Last Page

    3972

    WOS Identifier

    WOS:000325802800071

    ISSN

    0146-9592

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