SPECIAL ISSUE-2009 INTERNATIONAL ELECTRON DEVICES AND MATERIALS SYMPOSIUM (IEDMS)

    Authors

    J. J. Liou;C. S. Lai

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Microelectron. Reliab.

    Keywords

    Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied

    Journal Title

    Microelectronics Reliability

    Volume

    50

    Issue/Number

    5

    Publication Date

    1-1-2010

    Document Type

    Editorial Material

    Language

    English

    First Page

    583

    Last Page

    583

    WOS Identifier

    WOS:000278728700001

    ISSN

    0026-2714

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