Title

SPECIAL ISSUE-2009 INTERNATIONAL ELECTRON DEVICES AND MATERIALS SYMPOSIUM (IEDMS)

Authors

Authors

J. J. Liou;C. S. Lai

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Microelectron. Reliab.

Keywords

Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied

Journal Title

Microelectronics Reliability

Volume

50

Issue/Number

5

Publication Date

1-1-2010

Document Type

Editorial Material

DOI Link

http://dx.doi.org/10.1016/j.microrel.2010.02.010

Language

English

First Page

583

Last Page

583

WOS Identifier

WOS:000278728700001

ISSN

0026-2714

Recommended Citation

"SPECIAL ISSUE-2009 INTERNATIONAL ELECTRON DEVICES AND MATERIALS SYMPOSIUM (IEDMS)" (2010). Faculty Bibliography 2010s. 449.
https://stars.library.ucf.edu/facultybib2010/449