Time interleaved analog to digital converters: Tutorial 44

    Authors

    C. R. Parkey;W. B. Mikhael

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Instrum. Meas. Mag.

    Keywords

    MISMATCH ERRORS; ADC; CMOS; COMPENSATION; CALIBRATION; SYSTEMS; Engineering, Electrical & Electronic; Instruments & Instrumentation

    Journal Title

    Ieee Instrumentation & Measurement Magazine

    Volume

    16

    Issue/Number

    6

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    42

    Last Page

    51

    WOS Identifier

    WOS:000329848400007

    ISSN

    1094-6969

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