Self-healing reconfigurable logic using autonomous group testing

    Authors

    C. A. Sharma; A. Sarvi; A. Alzahrani;R. F. DeMara

    Comments

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    Abbreviated Journal Title

    Microprocess. Microsyst.

    Keywords

    Autonomous systems; Group testing; Reconfigurable architectures; Evolvable hardware; Reliable systems; Organic computing; SPACE; SYSTEMS; SCHEME; ARRAYS; FPGAS; Computer Science, Hardware & Architecture; Computer Science, Theory &; Methods; Engineering, Electrical & Electronic

    Abstract

    A group-testing-based fault resolution is incorporated into SRAM-based reconfigurable Field Programmable Gate Arrays (FPGAs) to provide an evolvable hardware system with self-healing and self-organizing properties. The proposed approach employs adaptive group testing techniques to autonomously maintain FPGA resource viability information as an organic means of transient and permanent fault resolution. Reconfigurability of the SRAM-based FPGA is leveraged to locate faulty logic resources which are successively excluded by group testing using alternate device configurations. This simplifies the system architect's role to definition of functionality using a high-level Hardware Description Language (HDL) and system-level performance vs. availability operating point. System availability, throughput, and mean time to isolate faults are monitored and maintained using an observer-controller model. The proposed group testing method operates on the output response produced for real-time operational inputs, which eliminates the need for dedicated test vectors. The proposed system was demonstrated using a Data Encryption Standard (DES) core on 4-input and 6-input LUT-based Xilinx FPGA models. With a single simulated stuck-at fault, the system identifies a completely validated replacement configuration within a few test stages. Results also include approaches for optimizing group size, resource redundancy, and availability. The approach demonstrates a readily-implemented yet robust organic hardware application that features a high degree of autonomous self-control. (C) 2012 Elsevier B.V. All rights reserved.

    Journal Title

    Microprocessors and Microsystems

    Volume

    37

    Issue/Number

    2

    Publication Date

    1-1-2013

    Document Type

    Article

    Language

    English

    First Page

    174

    Last Page

    184

    WOS Identifier

    WOS:000317166000006

    ISSN

    0141-9331

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