Portable Piezospectroscopy system: non-contact in-situ stress sensing through high resolution photo-luminescent mapping
Abbreviated Journal Title
J. Instrum.
Keywords
Spectrometers; Detection of defects; Data processing methods; THERMAL BARRIER COATINGS; CHROMIUM-DOPED SAPPHIRE; RESIDUAL-STRESS; OXIDATION STRESSES; FLUORESCENCE; SPECTROSCOPY; CALIBRATION; MICROPROBE; EVOLUTION; ALUMINA; Instruments & Instrumentation
Abstract
Through the piezospectroscopic effect, certain photo-luminescent materials, once excited with a laser, produce spectral emissions which are sensitive to the stress or strain that the material experiences. A system that utilizes the piezospectroscopic effect for non-contact stress detection over a material's surface can capture important information on the evolution of mechanical response under various conditions. Therefore, the components necessary for piezospectroscopic mapping and analysis have now been integrated into a versatile and transportable system that can be used with photo-luminescent materials in any load frame or on a variety of structures. This system combines compact hardware components such as a portable laser source, fiber optics, spectrograph, charge-coupled device (CCD), and an X-Y-Z stage (with focusing capabilities) with a series of data analysis algorithms capable of analyzing and outputting high resolution photo-luminescent (PL) maps on-site. Through a proof of concept experiment using a compressed polycrystalline alumina sample with sharp machined corners, this system successfully captured high resolution PL maps with a step size of 28.86 mu m/pixel and located high stress concentrations in critical areas, which correlated closely with the results of a finite element model. This work represents an important step in advancing the portability of piezospectroscopy for in-situ and non-contact stress detection. The instrumentation developed here has strong implications for the future of non-destructive evaluation and non-invasive structural health monitoring.
Journal Title
Journal of Instrumentation
Volume
9
Publication Date
1-1-2014
Document Type
Article
Language
English
First Page
11
WOS Identifier
ISSN
1748-0221
Recommended Citation
"Portable Piezospectroscopy system: non-contact in-situ stress sensing through high resolution photo-luminescent mapping" (2014). Faculty Bibliography 2010s. 5414.
https://stars.library.ucf.edu/facultybib2010/5414
Accessibility Statement
This item was created or digitized prior to April 24, 2027, or is a reproduction of legacy media created before that date. It is preserved in its original, unmodified state specifically for research, reference, or historical recordkeeping. In accordance with the ADA Title II Final Rule, the University Libraries provides accessible versions of archival materials upon request. To request an accommodation for this item, please submit an accessibility request form.
Comments
Authors: contact us about adding a copy of your work at [email protected]