Multi-frequency near-field scanning optical microscopy

    Authors

    D. C. Kohlgraf-Owens; L. Greusard; S. Sukhov; Y. De Wilde;A. Dogariu

    Comments

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    Abbreviated Journal Title

    Nanotechnology

    Keywords

    optical force; near-field scanning optical microscopy; opto-mechanics; scanning probe microscopy; atomic force microscopy; PROBE MICROSCOPY; FORCE MICROSCOPY; TUNING FORK; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied

    Abstract

    We demonstrate a new multi-frequency approach for mapping near-field optically induced forces with subwavelength spatial resolution. The concept relies on oscillating a scanning probe at two different frequencies. Oscillations at one frequency are driven electrically to provide positional feedback regulation. Modulations at another frequency are induced optically and are used to measure the mechanical action of the optical field on the probe. Because the measurement is based on locally detecting the force of the electromagnetic radiation acting on the probe, the new method does not require a photodetector to map the radiation distribution and, therefore, can provide true broadband detection of light with a single probe.

    Journal Title

    Nanotechnology

    Volume

    25

    Issue/Number

    3

    Publication Date

    1-1-2014

    Document Type

    Article

    Language

    English

    First Page

    6

    WOS Identifier

    WOS:000329040400004

    ISSN

    0957-4484

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