Title

Multi-frequency near-field scanning optical microscopy

Authors

Authors

D. C. Kohlgraf-Owens; L. Greusard; S. Sukhov; Y. De Wilde;A. Dogariu

Comments

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Abbreviated Journal Title

Nanotechnology

Keywords

optical force; near-field scanning optical microscopy; opto-mechanics; scanning probe microscopy; atomic force microscopy; PROBE MICROSCOPY; FORCE MICROSCOPY; TUNING FORK; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied

Abstract

We demonstrate a new multi-frequency approach for mapping near-field optically induced forces with subwavelength spatial resolution. The concept relies on oscillating a scanning probe at two different frequencies. Oscillations at one frequency are driven electrically to provide positional feedback regulation. Modulations at another frequency are induced optically and are used to measure the mechanical action of the optical field on the probe. Because the measurement is based on locally detecting the force of the electromagnetic radiation acting on the probe, the new method does not require a photodetector to map the radiation distribution and, therefore, can provide true broadband detection of light with a single probe.

Journal Title

Nanotechnology

Volume

25

Issue/Number

3

Publication Date

1-1-2014

Document Type

Article

Language

English

First Page

6

WOS Identifier

WOS:000329040400004

ISSN

0957-4484

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