Authors

E. Tucker; J. D'Archangel; M. B. Raschke;G. Boreman

Comments

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Abbreviated Journal Title

J. Appl. Phys.

Keywords

REFLECTARRAY ANTENNA; OPTICAL MICROSCOPY; DESIGN; SCATTERING; NANOPARTICLE; REFLECTION; AMPLITUDE; ELEMENTS; ENERGY; TIP; Physics, Applied

Abstract

Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays.

Journal Title

Journal of Applied Physics

Volume

116

Issue/Number

4

Publication Date

1-1-2014

Document Type

Article

Language

English

First Page

8

WOS Identifier

WOS:000340710700109

ISSN

0021-8979

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