Abbreviated Journal Title
J. Appl. Phys.
Keywords
REFLECTARRAY ANTENNA; OPTICAL MICROSCOPY; DESIGN; SCATTERING; NANOPARTICLE; REFLECTION; AMPLITUDE; ELEMENTS; ENERGY; TIP; Physics, Applied
Abstract
Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays.
Journal Title
Journal of Applied Physics
Volume
116
Issue/Number
4
Publication Date
1-1-2014
Document Type
Article
DOI Link
Language
English
First Page
8
WOS Identifier
ISSN
0021-8979
Recommended Citation
Tucker, Eric; D'Archangel, Jeffrey; Raschke, Markus B.; and Boreman, Glenn, "Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths" (2014). Faculty Bibliography 2010s. 6196.
https://stars.library.ucf.edu/facultybib2010/6196
Comments
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