Quantitative infrared imaging of silicon-on-insulator microring resonators

    Authors

    M. L. Cooper; G. Gupta; J. S. Park; M. A. Schneider; I. B. Divliansky;S. Mookherjea

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    ADD-DROP FILTER; WAVE-GUIDES; LOSSES; Optics

    Abstract

    There is considerable research activity in multiresonator optical circuits in silicon photonics, e.g., for higher-order filters, advanced modulation format coding/decoding, or coupled-resonator optical waveguide delay lines. In diagnostics of such structures, it is usually not possible to measure each individual microring resonator without adding separate input and output waveguides to each resonator. We demonstrate a non-invasive diagnostic method of quantitative IR imaging, applied here to a series cascade of rings. The IR images contain information on the otherwise inaccessible individual through ports and the resonators themselves, providing an efficient means to obtain coupling, loss, and intensity-enhancement parameters for the individual rings. (C) 2010 Optical Society of America

    Journal Title

    Optics Letters

    Volume

    35

    Issue/Number

    5

    Publication Date

    1-1-2010

    Document Type

    Article

    Language

    English

    First Page

    784

    Last Page

    786

    WOS Identifier

    WOS:000275826700057

    ISSN

    0146-9592

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