Title
Quantitative infrared imaging of silicon-on-insulator microring resonators
Abbreviated Journal Title
Opt. Lett.
Keywords
ADD-DROP FILTER; WAVE-GUIDES; LOSSES; Optics
Abstract
There is considerable research activity in multiresonator optical circuits in silicon photonics, e.g., for higher-order filters, advanced modulation format coding/decoding, or coupled-resonator optical waveguide delay lines. In diagnostics of such structures, it is usually not possible to measure each individual microring resonator without adding separate input and output waveguides to each resonator. We demonstrate a non-invasive diagnostic method of quantitative IR imaging, applied here to a series cascade of rings. The IR images contain information on the otherwise inaccessible individual through ports and the resonators themselves, providing an efficient means to obtain coupling, loss, and intensity-enhancement parameters for the individual rings. (C) 2010 Optical Society of America
Journal Title
Optics Letters
Volume
35
Issue/Number
5
Publication Date
1-1-2010
Document Type
Article
Language
English
First Page
784
Last Page
786
WOS Identifier
ISSN
0146-9592
Recommended Citation
"Quantitative infrared imaging of silicon-on-insulator microring resonators" (2010). Faculty Bibliography 2010s. 63.
https://stars.library.ucf.edu/facultybib2010/63
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu