Title
Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal
Abbreviated Journal Title
Microelectron. Reliab.
Keywords
Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
Abstract
This paper presents RF power amplifier adaptive body bias compensation technique for output power and power-added efficiency resilience to process and temperature variations. The adaptive body biasing scheme uses a phase-lock loop for variability sensing to provide resilience through the threshold voltage adjustment to maintain power amplifier performance over a wide range of variability. Analytical equations are derived for physical insight. Circuit simulation results show that the adaptive body biasing design improves the robustness of the power amplifier in output power and power-added efficiency over process and temperature variations. (C) 2013 Elsevier Ltd. All rights reserved.
Journal Title
Microelectronics Reliability
Volume
54
Issue/Number
1
Publication Date
1-1-2015
Document Type
Article
Language
English
First Page
167
Last Page
171
WOS Identifier
ISSN
0026-2714
Recommended Citation
"Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal" (2015). Faculty Bibliography 2010s. 6348.
https://stars.library.ucf.edu/facultybib2010/6348
Comments
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