Title

A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction

Authors

Authors

F. J. Garcia-Sanchez; A. Ortiz-Conde; J. Muci; A. Sucre-Gonzalez;J. J. Liou

Comments

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Abbreviated Journal Title

Microelectron. Reliab.

Keywords

MOSFET model parameter extraction; Successive differentiation; Successive integration; Threshold voltage; Minimalist MOSFET model; THRESHOLD-VOLTAGE EXTRACTION; I-V CHARACTERISTICS; EXPLICIT ANALYTIC; SOLUTIONS; HARMONIC DISTORTION; SERIES RESISTANCE; SOLAR-CELLS; TRANSISTORS; DESIGN; TRANSCONDUCTANCE; METHODOLOGY; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied

Abstract

This article provides a unified look at MOSFET model parameter extraction methods that rely on the application of successive differential and integral operators, their ratios, and various other combinations thereof. Some of the most representative extraction procedures are assessed by comparatively examining their ability to extract basic model parameters from synthetic MOSFET transfer characteristics, generated by an ad hoc minimalist four-parameter model. The model used, comprised of a single polylogarithm function of gate voltage, approximately describes in a very concise manner the essential features of MOSFET drain current continuously from depletion to strong inversion. The exponential-like low voltage and monomial-like high voltage asymptotes of this simple model are conveniently used to analyze and compare the different extraction schemes that are founded on successive differentiation or integration. In addition to providing a combined view useful for comparative methodological appraisal, the present unified analysis facilitates visualizing and exploring other potentially promising extraction strategies beyond the straightforward use of successive differential and integral operators and their ratios. We include examples of parameter extraction from measured transfer characteristics of real experimental MOSFETs to comparatively illustrate the actual numerical implementation of typical successive differential and integral operator-based procedures. (C) 2014 Elsevier Ltd. All rights reserved.

Journal Title

Microelectronics Reliability

Volume

55

Issue/Number

2

Publication Date

1-1-2015

Document Type

Article

Language

English

First Page

293

Last Page

307

WOS Identifier

WOS:000349724600001

ISSN

0026-2714

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