Title
High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification
Abbreviated Journal Title
Micron
Keywords
Hollow-cone dark field; Nanocrystalline; Grain size quantification; TEM; BACK-ETCH METHOD; FILMS; TEM; Microscopy
Abstract
In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imaging, with a slightly convergent beam, as an improved technique that is suitable to form high contrast micrographs for nanocrystalline grain size quantification. We also examine the various factors that influence the HCDF TEM image quality, including the conditions of microscopy (alignment, focus and objective aperture size), the properties of the materials imaged (e.g., atomic number, strain, defects), and the characteristics of the TEM sample itself (e.g., thickness, ion milling artifacts). Sample preparation was found to be critical and an initial thinning by wet etching of the substrate (for thin film samples) or tripod polishing (for bulk samples), followed by low-angle ion milling was found to be the preferred approach for preparing high-quality electron transparent samples for HCDF imaging. (C) 2009 Elsevier Ltd. All rights reserved.
Journal Title
Micron
Volume
41
Issue/Number
3
Publication Date
1-1-2010
Document Type
Review
Language
English
First Page
177
Last Page
182
WOS Identifier
ISSN
0968-4328
Recommended Citation
"High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification" (2010). Faculty Bibliography 2010s. 982.
https://stars.library.ucf.edu/facultybib2010/982
Comments
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