Photoelectrochemical Characterization of High-Ga Content CIGS2 Thin Films

Secondary Author(s)

Turner, John A.; Fernandez, Arturo M.

Keywords

PV Modules; Photoelectrochemical characterization; CIGS2 thin films; Photocurrent spectroscopy; Electrochemical analysis; Semiconductor materials

Abstract

This paper presents a study of photoelectrochemical characterization of CuIn1-xGaxS2 (CIGS2) thin films with Ga content, x, of 0.3-0.5. Flat band potential, doping density ND, and bandgap have been determined using photocurrent spectroscopy. CIGS2 thin film samples on Mo-coated glass substrates with Ohmic contacts were mounted on an electrode tip coated with silver paint. A three-electrode system was used with platinum mesh as the counter electrode, a saturated calomel electrode (SCE) as reference electrode, and the sample as working electrode. Variation of capacitance voltage at different frequencies was measured in a buffer solution with a computer controlled Impedance Gainphase Analyzer module SI1260 connected to an Electrochemical Interface SI1287 of Solartron. Photocurrent spectroscopy was carried out in a buffer solution with a 250 W Oriel tungsten halogen quartz lamp, monochromator, a chopper, optical filters, a lock-in amplifier SR530, and Potentiostat VersasStar II of EG

Date Published

1-28-2003

Identifiers

562

Subjects

Thin films; Photoelectrochemistry; Semiconductors; Electrochemical analysis; Photocurrent spectroscopy

Local Subjects

PV Modules

Collection

FSEC Energy Research Center® Collection

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