Diagnostic Analysis of Silicon Photovoltaic Modules After 20-Year Field Exposure
Secondary Author(s)
King, David; Hosking, F; Kratochvil, J; Johnson, R; Dhere, Neelkanth; Pandit, Mandar
Keywords
Silicon photovoltaic modules; Spectrolab Inc.; Field exposure; Durability testing; Photovoltaic module performance; Polyvinyl-butyral encapsulant; Silicon oxide anti-reflective coating
Abstract
The objective of this study was to investigate the technology used by Spectrolab Inc. to manufacture photovoltaic modules that have provided twenty years of reliable service at Natural Bridges National Monument in southeastern Utah. A field survey, system performance tests, and a series of module and materials tests have confirmed the durability of the modules in the array. The combination of manufacturing processes, materials, and quality controls used by Spectrolab resulted in modules that have maintained a performance level close to the original specifications for twenty years. Specific contributors to the durability of the modules included polyvinyl-butyral (PVB) encapsulant, expanded metal interconnects, silicon oxide anti-reflective coating, and excellent solder/substrate solderability
Date Published
9-15-2000
Identifiers
623
Subjects
Photovoltaic power systems; Solar cells; Materials--Testing; Manufacturing processes; Quality control; Concrete--Service life; Renewable energy sources
Local Subjects
PV Modules
Type
Text; Document
Collection
FSEC Energy Research Center® Collection
STARS Citation
Florida Solar Energy Center and Quintana, Michael, "Diagnostic Analysis of Silicon Photovoltaic Modules After 20-Year Field Exposure" (2000). FSEC Energy Research Center®. 623.
https://stars.library.ucf.edu/fsec/623
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