Abstract

A dual beam low coherence interferometer with improved signal to noise ratio. The interferometer directs both a collimated beam about a focused beam to a target. A detector detects the multiscattering from the target with a splitter where a reference arm with matched mirrors allows for measuring both the intensity and magnitude values of the beam to be measured. The intensity and magnitude values indicate the imaging of the target in applications such as OCT(optical coherence tomography) having medical imaging applications, while improving the signal to noise ratios. Other applications include material characterization in ceramics, composites and other granular material. Additionally, the interferometer can be used to image target defects such as inclusions, voids, cracks, and the like, in ceramics and other materials which scatter light.

Document Type

Patent

Patent Number

US 6,256,102

Application Serial Number

09/300,528

Issue Date

7-3-2001

Current Assignee

UCFRF

Assignee at Issuance

UCFRF

College

College of Optics and Photonics

Department

CREOL

Allowance Date

3-27-2001

Filing Date

4-27-1999

Assignee at Filing

UCFRF

Filing Type

Nonprovisional Application Record

Donated

no

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