Abstract
Provided are systems and methods for performing high-precision length measurement. One such system includes: an optical receiver, configure to receive a reflected optical pulse from a target; an optical combiner, configured to generate a combined optical pulse using the reflected optical pulse and a reference optical pulse; and a signal analyzer configured to determine a distance to the target using a depth of modulation value of the combined signal. A method as disclosed herein includes the steps of determining a first length component of a combined optical signal using a depth of modulation value and determining a second length component of the combined optical signal using a modulation period value.
Document Type
Patent
Patent Number
US 7,460,242
Application Serial Number
11/512,966
Issue Date
12-2-2008
Current Assignee
UCFRF
Assignee at Issuance
UCFRF
College
College of Optics and Photonics
Department
CREOL
Allowance Date
8-12-2008
Filing Date
8-30-2006
Assignee at Filing
UCFRF
Filing Type
Nonprovisional Application Record
Donated
no
Recommended Citation
Delfyett, Peter, "Systems and Methods for High-Precision Length Measurement" (2008). UCF Patents. 568.
https://stars.library.ucf.edu/patents/568