Abstract

A differential curvature sensing device for measuring a wavefiont curvature by employing increased spatial sampling for wavefront testing with mid-frequency error recovery. The device includes a sampling sensor having an output beam, an optical element to split said output beam, a lenslet array in the path of each beam to generate corresponding sampling grids, a shearing element for shifting the grid points in horizontal and vertical directions to produce plural sampling grids having plural grid points for use generating a spatial sampling grid having a density for mid-spatial frequency recovery. The displacement of the shifting less than a pitch size of the lenslet array, and a measuring device measuring plural slopes of plural wavefronts at each grid point to obtain a wavefront normal curvature and corresponding twist curvature terms to determine a principal curvature and directions. The sensor is a Shack-Hartman sensor, shearing interferometer sensor and other discrete-point sampli

Document Type

Patent

Patent Number

US 7,619,191 B1

Application Serial Number

12/062,674

Issue Date

11-17-2009

Current Assignee

UCFRF

Assignee at Issuance

UCFRF

College

College of Optics and Photonics

Department

CREOL

Allowance Date

11-17-2009

Filing Date

4-4-2008

Assignee at Filing

UCFRF

Filing Type

Nonprovisional Application Record

Donated

no

Download Patent

Share

COinS